Labsoft

XRD, SCXRD DIFFRACTOMETERS,
EDXRF, WDXRF, μXRF SPECTROMETERS

Full range of powder and single crystal diffractometers and analytical XRF and microXRF spectrometers.

ATOMIC FORCE
MICROSCOPY
AND PROFILOMETRY

AFM and SPM microscopes, wide range of operation modes and AFM probes, stylus and optical 3D surface profilers

ELECTRON
MICROSCOPY
AND DUAL BEAM SYSTEMS

Full range of SEM, TEM and dual beam microscopes and analytical EDS, WDS, EBSD systems, cryo-techniques, litography, micromanipulators, sample preparation instruments and materials

SERVICE
AND SUPPORT

Specialized technical service, user training and application oriented suport

THIN FILM
DEPOSITION,
SURFACE ANALYSIS

RIE, CVD, ALD and MBE reactors for surface modification and thin-film deposition, tribometers, scratch testers, ellipsometers and indentation testers for surface and layer characterization