XRD, SCXRD DIFFRACTOMETERS,
EDXRF, WDXRF, μXRF SPECTROMETERS
Full range of powder and single crystal diffractometers and analytical XRF and microXRF spectrometers.
AFM and SPM microscopes, wide range of operation modes and AFM probes, stylus and optical 3D surface profilers
Full range of SEM, TEM and dual beam microscopes and analytical EDS, WDS, EBSD systems, cryo-techniques, litography, micromanipulators, sample preparation instruments and materials
Specialized technical service, user training and application oriented suport
RIE, CVD, ALD and MBE reactors for surface modification and thin-film deposition, tribometers, scratch testers, ellipsometers and indentation testers for surface and layer characterization